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  • >FTIR Silicon Windows

    • FTIR Silicon Windows

    The FTIR (Fourier Transform Infrared Spectrometer) window of silicon material has a wide range of applications in infrared spectroscopy analysis. Silicon is a common semiconductor material with high transparency, good chemical stability, and mechanical strength. In infrared spectroscopy analysis, silicon window plates can transmit specific wavelengths of infrared light, thereby achieving spectral analysis of samples. It is widely used in infrared spectrum analysis, laser applications and other fields. In addition to silicon materials, micron optics can also provide FTIR window pieces made of calcium fluoride, barium fluoride, lithium fluoride, zinc selenide, zinc sulfide, fused silica and other materials.

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    Technical Parameter

    Material Data

    Transmittance

    Application Field

    Related Products
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    <100>silicon N-type
    		 
    More+ Less 6 1 60-40 5(3) <100>silicon N-type

    Φ6mm，ThK 1mm，FTIR Silicon Windows

    Number：PSi01B001

    Dia(mm)：6 ThK(mm)：1 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 13 1 60-40 5(3) <100>silicon N-type

    Φ13mm，ThK 1mm，FTIR Silicon Windows

    Number：PSi01C004

    Dia(mm)：13 ThK(mm)：1 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 13 2 60-40 5(3) <100>silicon N-type

    Φ13mm，ThK 2mm，FTIR Silicon Windows

    Number：PSi01C005

    Dia(mm)：13 ThK(mm)：2 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 15 2 60-40 5(3) <100>silicon N-type

    Φ15mm，ThK 2mm，FTIR Silicon Windows

    Number：PSi01C007

    Dia(mm)：15 ThK(mm)：2 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 20 2 60-40 5(3) <100>silicon N-type

    Φ20mm，ThK 2mm，FTIR Silicon Windows

    Number：PSi01D001

    Dia(mm)：20 ThK(mm)：2 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 25 2 60-40 5(3) <100>silicon N-type

    Φ25mm，ThK 2mm，FTIR Silicon Windows

    Number：PSi01E001

    Dia(mm)：25 ThK(mm)：2 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 25 4 60-40 5(3) <100>silicon N-type

    Φ25mm，ThK 4mm，FTIR Silicon Windows

    Number：PSi01E002

    Dia(mm)：25 ThK(mm)：4 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 25 5 60-40 5(3) <100>silicon N-type

    Φ25mm，ThK 5mm，FTIR Silicon Windows

    Number：PSi01E003

    Dia(mm)：25 ThK(mm)：5 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 32 3 60-40 5(3) <100>silicon N-type

    Φ32mm，ThK 3mm，FTIR Silicon Windows

    Number：PSi01F001

    Dia(mm)：32 ThK(mm)：3 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
    More+ Less 38 6 60-40 5(3) <100>silicon N-type

    Φ38mm，ThK 6mm，FTIR Silicon Windows

    Number：PSi01F003

    Dia(mm)：38 ThK(mm)：6 Surface Quality：60-40 Surface Accuracy：5(3) Parallelism：3′ Orientation Tolerance：±0.5° Diameter Tolerance(mm)：0.0/-0.1 Thk Tolerance(mm)：±0.1 Transmission Range：1.2-15μm Substrate Material：<100>silicon N-type Bevel(mm)：0.35 Chipping(mm)：0.35 REACH：Compliant ROHS：Compliant
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    Material Data
    Optical Properties
    Transmission Range1.2-15μm
    Refractive Index3.41776%@10μm
    Reflection Loss46.1%@10μm
    StructureSingle crystal,synthetic
    Cleavage Planes<111>
    Physical Properties
    Density [g/cm3]2.33
    Melting Point [℃]1414
    Thermal Conductivity [W/(m×K)]163 @ 313K
    Thermal Expansion [10-6/K]2.6 @ 293K
    Knoop Hardness [kg/mm2]1100
    Specific Heat Capacity [J/(kg×K)]712.8
    Dielectric Constant13 @f= 9.37GHz
    Young's Modulus (E) [GPa]130.91
    Shear Modulus(G) [GPa]79.92
    Bulk Modulus(K) [GPa]101.97
    Poisson Coefficient0.266
    Chemical Properties
    Solubility / g/LNone
    Molecular Weight / g/mol28.09

    Silicon Transmittance Curve-CZSilicon Transmittance Curve-FZ

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